Timing performance of nanometer digital circuits under process variations 1st ed.

Author

• Champac, Victor

Additional Author(s)

• Garcia Gervacio, Jose

Publisher

Cham, Switzerland : Springer International Publishing, 2018

Language

English

ISBN

9783319754659

Series

Frontiers in electronic testing 39

Subject(s)

• MICROELECTRONICS
• MICROPROCESSORS
• RADIO CIRCUITS

Notes

. .

Abstract

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.

Physical Dimension

Number of Page(s)

1 online resource (xviii, 185 p.)

Dimension

-

Other Desc.

ill. (in col.)

Summary / Review / Table of Content

Introduction --
Mathematical Fundamentals --
Process Variations --
Gate delay under process variations --
Path Delay Under Process Variations --
Circuit Analysis under Process Variations --
FinFET Technology and design issues.

Exemplar(s)

#	Accession No.	Call Number	Location	Status
1.	01010/20	621.3815 Cha T	Online !	Available