User-centric ultra-dense networks for 5G 1st ed.

Author

• Chen, Shanzhi

Additional Author(s)

• Qin, Fei
• Hu, Bo
• Li, Xi
• Chen, Zhonglin
• Liu, Jiamin

Publisher

Cham, Switzerland : Springer International Publishing, 2018

Language

English

ISBN

9783319612010

Series

SpringerBriefs in electrical and computer engineering

Subject(s)

• CELL PHONE SYSTEMS--STANDARDS
• ELECTRICAL ENGINEERING
• COMPUTER NETWORKS

Notes

. .

Abstract

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.

Physical Dimension

Number of Page(s)

1 online resource (xiv, 77 p.)

Dimension

-

Other Desc.

ill. (in color.)

Summary / Review / Table of Content

Introduction --
Low-Noise CMOS Image Sensors --
Noise Sources and Mechanisms in CIS --
Detailed Noise Analysis in Low-Noise CMOS Image Sensors --
Noise Reduction in CIS Readout Chains --
Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process --
Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process --
A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling --
Downscaling Effects Towards Photon Counting Capability in CIS --
An Ultra Low Noise CMOS THz Imager -- Conclusion.

Exemplar(s)

#	Accession No.	Call Number	Location	Status
1.	01049/20	621.38456 Che U	Online !	Available