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LabVIEW based automation guide for microwave measurements 1st ed.

Author
  • Dubey, Satya Kesh
Additional Author(s)
  • Narang, Naina
  • Negi, P. S.
  • Ojha, V. N.
Publisher
Singapore: Springer Nature Singapore Pte Ltd., 2018
Language
English
ISBN
9789811062803
Series
SpringerBriefs in computational electromagnetics
Subject(s)
  • MICROWAVES
  • ELECTRICAL ENGINEERING
  • OPTICAL ENGINEERING
Notes
. .
Abstract
The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). .
Physical Dimension
Number of Page(s)
1 online resource (xiv, 45 p.)
Dimension
-
Other Desc.
ill. (in color.)
Summary / Review / Table of Content
No summary / review / table of content available!
Exemplar(s)
# Accession No. Call Number Location Status
1.01815/20620 Dub LOnline !Available

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