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EM material characterization techniques for metamaterials 1st ed.

Author
  • Nair, Raveendranath U.
Additional Author(s)
  • Dutta, Maumita
  • P.S., Mohammed Yazeen
  • Venu, K. S.
Publisher
Singapore: Springer Nature Singapore Pte Ltd., 2018
Language
English
ISBN
9789811065170
Series
SpringerBriefs in computational electromagnetics
Subject(s)
  • METAMATERIALS
  • MICROWAVES
  • OPTICAL MATERIALS
Notes
. .
Abstract
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials  .
Physical Dimension
Number of Page(s)
1 online resource (xxiii, 50 p.)
Dimension
-
Other Desc.
ill. (in color.)
Summary / Review / Table of Content
No summary / review / table of content available!
Exemplar(s)
# Accession No. Call Number Location Status
1.01818/20620.11 Nai EOnline !Available

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